Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions

Details Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions

1998-02-27

arxiv.org/abs/cond-mat/9802293v2

IEEE MTT-S Int. Microwave Symp. Digest, p. 965 (1998)

Physics

Condensed Matter

Materials Science

4 pages, 8 figures, minor corrections to text and 2 figures

Scientific paper

We describe the near-field microwave microscopy of microwave devices on a
length scale much smaller than the wavelength used for imaging. Our microscope
can be operated in two possible configurations, allowing a quantitative study
of either material properties or local electric fields.

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