Near-Field Microwave Microscopy of Materials Properties

Details Near-Field Microwave Microscopy of Materials Properties Near-Field Microwave Microscopy of Materials Properties

2000-01-07

arxiv.org/abs/cond-mat/0001075v2

Microwave Superconductivity, edited by H. Weinstock and M. Nisenoff, (Kluwer, Amsterdam, 2001), pp. 239-269

Physics

Condensed Matter

Materials Science

31 pages, 9 figures, lecture given at the 1999 NATO ASI on Microwave Superconductivity Changes suggested by editor, including

Scientific paper

Near-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics, experiments can be carried out at high spatial resolution over a broad frequency range. In addition, the measurements can be done quantitatively so that images of microwave materials properties can be created. We review the five major types of near-field microwave microscopes and discuss our own form of microscopy in detail. Quantitative images of microwave sheet resistance, dielectric constant, and dielectric tunability are presented and discussed. Future prospects for near-field measurements of microwave electrodynamic properties are also presented.

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