Nanoscale Quantification of Octahedral Tilts in Perovskite Films

Details Nanoscale Quantification of Octahedral Tilts in Perovskite Films Nanoscale Quantification of Octahedral Tilts in Perovskite Films

2012-04-26

arxiv.org/abs/1204.5982v1

Physics

Condensed Matter

Materials Science

The manuscript has been accepted by Applied Physics Letters. After it is published, it will be found at: http://apl.aip.org/

Scientific paper

NiO6-octahedral tilts in ultrathin LaNiO3 films were studied using position averaged convergent beam electron diffraction (PACBED) in scanning transmission electron microscopy. Both the type and magnitude of the octahedral tilts were determined by comparing PACBED experiments to frozen phonon multislice simulations. It is shown that the out-of-plane octahedral tilt of an epitaxial film under biaxial tensile stress (0.78 % in-plane tensile strain) increases by ~ 20%, while the in-plane rotation decreases by ~ 80%, compared to the unstrained bulk material.

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