Nanoscale domains in strained epitaxial BiFeO3 thin Films on LaSrAlO4 Substrate

Details Nanoscale domains in strained epitaxial BiFeO3 thin Films on LaSrAlO4 Substrate Nanoscale domains in strained epitaxial BiFeO3 thin Films on LaSrAlO4 Substrate

2011-01-07

arxiv.org/abs/1101.1343v1

Applied Physics Letters 96, 252903 (2010)

Physics

Condensed Matter

Materials Science

14 pages, 4 figures

Scientific paper

10.1063/1.3456729

BiFeO3 thin films with various thicknesses were grown epitaxially on (001) LaSrAlO4 single crystal substrates using pulsed laser deposition. High resolution x-ray diffraction measurements revealed that a tetragonal-like phase with c-lattice constant ~4.65 {\AA} is stabilized by a large misfit strain. Besides, a rhombohedral-like phase with c-lattice constant ~3.99 {\AA} was also detected at film thickness of ~50 nm and above to relieve large misfit strains. In-plane piezoelectric force microscopy studies showed clear signals and self-assembled nanoscale stripe domain structure for the tetragonal-like regions. These findings suggest a complex picture of nanoscale domain patterns in BiFeO3 thin films subjected to large compressive strains.

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