Nanometer Scale Dielectric Fluctuations at the Glass Transition

Details Nanometer Scale Dielectric Fluctuations at the Glass Transition Nanometer Scale Dielectric Fluctuations at the Glass Transition

1998-07-08

arxiv.org/abs/cond-mat/9807126v1

Phys. Rev. Lett., 81, 1461 (1998).

Physics

Condensed Matter

Disordered Systems and Neural Networks

4 pages, 4 embedded PS figures, RevTeX - To appear in Phys. Rev. Lett

Scientific paper

10.1103/PhysRevLett.81.1461

Using non-contact scanning probe microscopy (SPM) techniques, dielectric properties were studied on 50 nanometer length scales in poly-vinyl-acetate (PVAc) films in the vicinity of the glass transition. Low frequency (1/f) noise observed in the measurements, was shown to arise from thermal fluctuations of the electric polarization. Anomalous variations observed in the noise spectrum provide direct evidence for cooperative nano-regions with heterogeneous kinetics. The cooperative length scale was determined. Heterogeneity was long-lived only well below the glass transition for faster than average processes.

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