Morphological instability, evolution, and scaling in strained epitaxial films: An amplitude equation analysis of the phase field crystal model

Details Morphological instability, evolution, and scaling in strained epitaxial films: An amplitude equation analysis of the phase field crystal model Morphological instability, evolution, and scaling in strained epitaxial films: An amplitude equation analysis of the phase field crystal model

2010-03-12

arxiv.org/abs/1003.2611v1

Phys. Rev. B 81, 165421 (2010)

Physics

Condensed Matter

Materials Science

16 pages, 10 figures; to be published in Phys. Rev. B

Scientific paper

Morphological properties of strained epitaxial films are examined through a mesoscopic approach developed to incorporate both the film crystalline structure and standard continuum theory. Film surface profiles and properties, such as surface energy, liquid-solid miscibility gap and interface thickness, are determined as a function of misfit strains and film elastic modulus. We analyze the stress-driven instability of film surface morphology that leads to the formation of strained islands. We find a universal scaling relationship between the island size and misfit strain which shows a crossover from the well-known continuum elasticity result at the weak strain to a behavior governed by a "perfect" lattice relaxation condition. The strain at which the crossover occurs is shown to be a function of liquid-solid interfacial thickness, and an asymmetry between tensile and compressive strains is observed. The film instability is found to be accompanied by mode coupling of the complex amplitudes of the surface morphological profile, a factor associated with the crystalline nature of the strained film but absent in conventional continuum theory.

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