Monte Carlo simulation of spin relaxation in nanowires and 2-D channels of II-VI semiconductors

Physics – Condensed Matter – Mesoscale and Nanoscale Physics

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

14 pages, 32 figures

Scientific paper

We have analysed spin relaxation behaviour of various II-VI semiconductors for nanowire structure and 2-D channel by simulating spin polarized transport through a semi-classical approach. Monte Carlo simulation method has been applied to simulate our model. D'yakanov-Perel mechanism and Elliot-Yafet mechanism are dominant for spin relaxation in II-VI semiconductors. Variation in spin relaxation length with external field has been analysed and comparison is drawn between nanowire and 2-D channels. Spin relaxation lengths of various II-VI semiconductors are compared at an external field of 1kV/cm to understand the predominant factors affecting spin de-phasing in them. Among the many results obtained, most noticeable one is that spin relaxation length in nanowires is many times greater than that in 2-D channel.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Monte Carlo simulation of spin relaxation in nanowires and 2-D channels of II-VI semiconductors does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Monte Carlo simulation of spin relaxation in nanowires and 2-D channels of II-VI semiconductors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Monte Carlo simulation of spin relaxation in nanowires and 2-D channels of II-VI semiconductors will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-140154

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.