Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape

Details Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape

2003-09-29

arxiv.org/abs/cond-mat/0309667v2

Ultramicroscopy, Volume 102, Issue 1, December 2004, Pages 7-12

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

5 pages, 3 figures

Scientific paper

We present a numerical method to model electric field sensitive scanning
probe microscopy measurements which allows for a tip of arbtrary shape and
invokes image charges to exactly account for a sample dielectric overlayer. The
method is applied to calculate the spatial resolution of a subsurface charge
accumulation imaging system, achieving reasonable agreement with experiment.

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