Physics – Condensed Matter – Materials Science
Scientific paper
2007-10-02
Physics
Condensed Matter
Materials Science
7 pages, 3 figures
Scientific paper
10.1103/PhysRevB.77.075413
Low-energy electron microscopy (LEEM) was used to measure the reflectivity of low-energy electrons from graphitized SiC(0001). The reflectivity shows distinct quantized oscillations as a function of the electron energy and graphite thickness. Conduction bands in thin graphite films form discrete energy levels whose wave vectors are normal to the surface. Resonance of the incident electrons with these quantized conduction band states enhances electrons to transmit through the film into the SiC substrate, resulting in dips in the reflectivity. The dip positions are well explained using tight-binding and first-principles calculations. The graphite thickness distribution can be determined microscopically from LEEM reflectivity measurements.
Hibino H.
Kageshima H.
Kobayashi Yasuaki
Maeda F.
Nagase Masayuki
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