Measuring the magnetization of three monolayer thick Co islands and films by X-ray dichroism

Details Measuring the magnetization of three monolayer thick Co islands and films by X-ray dichroism Measuring the magnetization of three monolayer thick Co islands and films by X-ray dichroism

2009-10-24

arxiv.org/abs/0910.4687v1

Phys. Rev. B 80, 172401 (2009)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

16 pages, three figures

Scientific paper

10.1103/PhysRevB.80.172401

Co islands and films are characterized by x-ray magnetic circular dichroism photoemission electron microscopy (XMCD-PEEM). The spatial resolution capabilties of the technique together with atomic growth control permit obtaining perfectly flat triangular islands with a given thickness (3 ML), very close to an abrupt spin-reorientation transition. The magnetic domain configurations are found to depend on island size: while small islands can be magnetized in a single-domain state, larger islands show more complex patterns. Furthermore, the magnetization pattern of the larger islands presents a common chirality. By means of dichroic spectro-microscopy at the Co L absorption edges, an experimental estimate of the ratio of the spin- and orbital magnetic moment for three monolayer thick films is obtained.

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