Physics – Condensed Matter – Materials Science
Scientific paper
2010-12-08
Thin Solid Films (2011) in print
Physics
Condensed Matter
Materials Science
Scientific paper
A spatially resolved electroluminescence (EL) imaging experiment is developed to measure the local sheet resistance of the window layer, directly on the completed CIGS cell. Our method can be applied to the EL imaging studies that are made in fundamental studies as well as in in-line process inspection (1-3). The EL experiment consists in using solar cell as a light emitting device : a voltage is applied to the cell and its luminescence is detected. We develop an analytical and quantitative model to simulate the behavior of CIGS solar cells based on the spread sheet resistance effect in the window layer. We determine the repartition of the electric potential on the ZnO, for given cell's characteristics such as sheet resistance and contact geometries. Knowing the repartition of the potential, the EL intensity is estimated and the experimental EL signal is fitted, which allows the determination of the window layer sheet resistance.
Guillemoles Jean Francois
Lincot Daniel
Lombez Laurent
Paire Myriam
No associations
LandOfFree
Measuring sheet resistance of CIGS solar cell's window layer by spatially resolved electroluminescence imaging does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Measuring sheet resistance of CIGS solar cell's window layer by spatially resolved electroluminescence imaging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring sheet resistance of CIGS solar cell's window layer by spatially resolved electroluminescence imaging will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-558058