Measuring Nanoscale Stress Intensity Factors with an Atomic Force Microscope

Details Measuring Nanoscale Stress Intensity Factors with an Atomic Force Microscope Measuring Nanoscale Stress Intensity Factors with an Atomic Force Microscope

2010-02-09

arxiv.org/abs/1002.1877v1

Physics

Classical Physics

5 pages, soumis \`a EPL

Scientific paper

Atomic Force Microscope images of a crack intersecting the free surface of a glass specimen are taken at different stages of subcritical propagation. From the analysis of image pairs, it is shown that a novel Integrated Digital Image Correlation technique allows to measure stress intensity factors in a quantitative fashion. Image sizes as small as 200 nm can be exploited and the surface displacement fields do not show significant deviations from linear elastic solutions down to a 10 nm distance from the crack tip. Moreover, this analysis gives access to the out-of-plane displacement of the free surface at the crack tip.

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