Measurements of Surface Diffusivity and Coarsening During Pulsed Laser Deposition

Details Measurements of Surface Diffusivity and Coarsening During Pulsed Laser Deposition Measurements of Surface Diffusivity and Coarsening During Pulsed Laser Deposition

2009-10-19

arxiv.org/abs/0910.3601v2

Physics

Condensed Matter

Materials Science

Scientific paper

Pulsed Laser Deposition (PLD) of homoepitaxial SrTiO3 <001> was studied with in-situ x-ray specular reflectivity and surface diffuse x-ray scattering. Unlike prior reflectivity-based studies, these measurements access both the time- and the length-scales of the evolution of the surface morphology during growth. In particular, we show that this technique allows direct measurements of the diffusivity for both inter- and intra-layer transport. Our results explicitly limit the possible role of island break-up, demonstrate the key roles played by nucleation and coarsening in PLD, and place an upper bound on the Ehrlich-Schwoebel (ES) barrier for downhill diffusion.

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