Measurement of statistical nuclear spin polarization in a nanoscale GaAs sample

Details Measurement of statistical nuclear spin polarization in a nanoscale GaAs sample Measurement of statistical nuclear spin polarization in a nanoscale GaAs sample

2011-09-02

arxiv.org/abs/1109.0411v2

Phys. Rev. B 84, 205328 (2011)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

20 pages, 6 figures, 1 supplementary file

Scientific paper

10.1103/PhysRevB.84.205328

We measure the statistical polarization of quadrupolar nuclear spins in a sub-micrometer (0.6 um^3) particle of GaAs using magnetic resonance force microscopy. The crystalline sample is cut out of a GaAs wafer and attached to a micro-mechanical cantilever force sensor using a focused ion beam technique. Nuclear magnetic resonance is demonstrated on ensembles containing less than 5 x 10^8 nuclear spins and occupying a volume of around (300 nm)^3 in GaAs with reduced volumes possible in future experiments. We discuss how the further reduction of this detection volume will bring the spin ensemble into a regime where random spin fluctuations, rather than Boltzmann polarization, dominate its dynamics. The detection of statistical polarization in GaAs therefore represents an important ?rst step toward 3D magnetic resonance imaging of III-V materials on the nanometer-scale.

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