Measurement of graphite tight-binding parameters using high field magneto-reflectance

Details Measurement of graphite tight-binding parameters using high field magneto-reflectance Measurement of graphite tight-binding parameters using high field magneto-reflectance

2011-06-29

arxiv.org/abs/1106.5948v2

Physics

Condensed Matter

Materials Science

Scientific paper

frared reflectance spectroscopy at 4K in fields up to 31T. Both Schr\"odinger-like (K-point) and Dirac-like (H-point) Landau level transitions have been observed, and their magnetic field dispersion are analyzed by a newly-derived limiting case of the Slonczewski-Weiss-McClure model. The values of the band parameters are evaluated without using sophisticated conductivity peak lineshape analysis. In this work, several less-explored band parameters are determined from the experimental results and they are known to result in electron-hole asymmetry and the opening of an energy gap between the electron and hole bands in multilayer and bilayer graphene systems.

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