Maximum Metallic Conductivity in Si-MOS Structures

Physics – Condensed Matter – Strongly Correlated Electrons

Scientific paper

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3 pages, 3 ps-figs, RevTex, new data

Scientific paper

10.1103/PhysRevB.60.R2154

We found that the conductivity of the two-dimensional electron system in
Si-MOS structures is limited to a maximum value, G_{max}, as either density
increases or temperature decreases. This value G_{max} is weakly disorder
dependent and ranging from 100 to 140 e^2/h for samples whose mobilities differ
by a factor of 4.

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