Physics – Condensed Matter
Scientific paper
1995-08-26
Physics
Condensed Matter
9 pages, RevTex, 4 figures available by fax. Send email to alison@wsrcc.com for more info. Submitted to '95 MMM proceedings
Scientific paper
10.1063/1.361926
Fe/Si multilayers with antiferromagnetic interlayer coupling have been grown via ion-beam sputtering on both glass and single-crystal substrates. High-angle x-ray diffraction measurements show that both sets of films have narrow Fe peaks, implying a large crystallite size and crystalline iron silicide spacer layers. Low-angle x-ray diffraction measurements show that films grown on glass have rougher interfaces than those grown on single-crystal substrates. The multilayers grown on glass have a larger remanent magnetization than the multilayers grown on single-crystal substrates. The observation of magnetocrystalline anisotropy in hysteresis loops and $(hkl)$ peaks in x-ray diffraction demonstrates that the films grown on MgO and Ge are epitaxial. The smaller remanent magnetization in Fe/Si multilayers with better layering suggests that the remanence is not an intrinsic property.
Chaiken Andrew
Michel Richard P.
Wang C.-T.
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