Magnetic field effect on the dielectric constant of glasses: Evidence of disorder within tunneling barriers

Details Magnetic field effect on the dielectric constant of glasses: Evidence of disorder within tunneling barriers Magnetic field effect on the dielectric constant of glasses: Evidence of disorder within tunneling barriers

2002-03-27

arxiv.org/abs/cond-mat/0203564v2

Phys. Rev. B 66, 064203 (2002)

Physics

Condensed Matter

latex Bcorrige1.tex, 5 files, 4 figures, 7 pages [SPEC-S02/009]

Scientific paper

10.1103/PhysRevB.66.064203

The magnetic field dependence of the low frequency dielectric constant $e_r$(H) of a structural glass a - SiO2 + xCyHz was studied from 400 mK to 50 mK and for H up to 3T. Measurement of both the real and the imaginary parts of $e_r$ is used to eliminate the difficult question of keeping constant the temperature of the sample while increasing H: a non-zero $e_r$(H) dependence is reported in the same range as that one very recently reported on multicomponent glasses. In addition to the recently proposed explanation based on interactions, the reported $e_r$(H) is interpreted quantitatively as a consequence of the disorder lying within the nanometric barriers of the elementary tunneling systems of the glass.

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