Low-temperature scanning probe microscopy using a tuning fork transducer

Details Low-temperature scanning probe microscopy using a tuning fork transducer Low-temperature scanning probe microscopy using a tuning fork transducer

2006-04-18

arxiv.org/abs/cond-mat/0604407v1

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

6 pages, 8 figures

Scientific paper

We have developed a low-temperature scanning probe microscope using a quartz tuning fork operating at 4.2 K. A silicon tip from a commercial cantilever was attached to one prong of the tuning fork. With a metallic coating, a potential could be applied to the tip to sense the charge distribution in a sample, while with a magnetically coated tip, magnetic force imaging could be performed. For the coarse approach mechanism, we developed a reliable low-temperature walker with low material cost and simple machining. We have obtained Coulomb force images of boron nanowires at room temperature and magnetic nano-structures at low temperature. For lift-mode scanning, we employed a frequency detection mode for the first topographic scan and phase detection mode for the second lift scan.

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