Physics – Condensed Matter – Materials Science
Scientific paper
2011-02-04
ACS Nano, 5, 2657 (2011)
Physics
Condensed Matter
Materials Science
17 pages; 7 figures
Scientific paper
We report on the low-frequency current fluctuations and electronic noise in thin-films made of bismuth selenide topological insulators. The films were prepared via the graphene-like mechanical exfoliation and used as the current conducting channels in the four- and two-contact devices. Analysis of the resistance dependence on the film thickness indicates that the surface contribution to conductance is dominant in our samples. It was established that the current fluctuations have the noise spectrum close to the pure 1/f in the frequency range from 1 to 10 kHz (f is the frequency). The relative noise amplitude S/I^2 for the examined films was increasing from ~5x10^-8 to 5x10^-6 (1/Hz) as the resistance of the channels varied from ~10^3 to 10^5 Ohms. The obtained noise data is important for understanding electron transport through the surface and volume of topological insulators, and proposed applications of this class of materials.
Balandin Alexander A.
Hossain Zakir Md.
Rumyantsev Sergey L.
Shahil Khan M. F.
Shur Michael
No associations
LandOfFree
Low-Frequency Current Fluctuations in Graphene-like Exfoliated Thin-Films of Topological Insulators does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Low-Frequency Current Fluctuations in Graphene-like Exfoliated Thin-Films of Topological Insulators, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Low-Frequency Current Fluctuations in Graphene-like Exfoliated Thin-Films of Topological Insulators will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-492025