Logarithmic corrections in the two-dimensional Ising model in a random surface field

Details Logarithmic corrections in the two-dimensional Ising model in a random surface field Logarithmic corrections in the two-dimensional Ising model in a random surface field

2004-02-06

arxiv.org/abs/cond-mat/0402188v2

J. Phys. A 37 (2004) 8801

Physics

Condensed Matter

Statistical Mechanics

10 pages, 4 figures, extended version with one new section

Scientific paper

10.1088/0305-4470/37/37/003

In the two-dimensional Ising model weak random surface field is predicted to be a marginally irrelevant perturbation at the critical point. We study this question by extensive Monte Carlo simulations for various strength of disorder. The calculated effective (temperature or size dependent) critical exponents fit with the field-theoretical results and can be interpreted in terms of the predicted logarithmic corrections to the pure system's critical behaviour.

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