Localization by disorder in the infrared conductivity of (Y,Pr)Ba2Cu3O7 films

Details Localization by disorder in the infrared conductivity of (Y,Pr)Ba2Cu3O7 films Localization by disorder in the infrared conductivity of (Y,Pr)Ba2Cu3O7 films

2001-06-27

arxiv.org/abs/cond-mat/0106555v1

Phys. Rev. B 65, 104509 (2002) (6 pages)

Physics

Condensed Matter

Superconductivity

7 pages with (4) figures included

Scientific paper

10.1103/PhysRevB.65.104509

The ab-plane reflectivity of (Y{1-x}Prx)Ba2Cu3O7 thin films was measured in the 30-30000 cm-1 range for samples with x = 0 (Tc = 90 K), x = 0.4 (Tc = 35 K) and x = 0.5 (Tc = 19 K) as a function of temperature in the normal state. The effective charge density obtained from the integrated spectral weight decreases with increasing x. The variation is consistent with the higher dc resistivity for x = 0.4, but is one order of magnitude smaller than what would be expected for x = 0.5. In the latter sample, the conductivity is dominated at all temperatures by a large localization peak. Its magnitude increases as the temperature decreases. We relate this peak to the dc resistivity enhancement. A simple localization-by-disorder model accounts for the optical conductivity of the x = 0.5 sample.

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