Physics – Condensed Matter – Materials Science
Scientific paper
2004-08-31
Physics
Condensed Matter
Materials Science
four figures, submitted to Phys. Rev. Lett
Scientific paper
10.1103/PhysRevLett.94.036403
Extended X-ray Absorption Fine Structure (EXAFS) experiments have been carried out on PrRu$_4$P$_{12}$ and PrOs$_4$P$_{12}$ to study the metal-to-insulator (MI) phase transition in PrRu$_4$P$_{12}$. No Pr displacement was observed across the MI transition temperature from the EXAFS data. Instead, our EXAFS data clearly show that a Ru displacement is associated with this MI transition. The very high Debye temperature for the Ru-P bond ($\Theta_D$=690 K) suggests that a slight rotation/displacement of relatively rigid RuP$_6$ octahedra leads to this small Ru displacement, which accompanies the MI transition at 62 K in PrRu$_4$P$_{12}$.
Bauer Eric D.
Bridges F.
Cao Daomin
Heffner Robert H.
Jeong Il-Kyoung
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