Local contact stress measurements at a rough interface

Details Local contact stress measurements at a rough interface Local contact stress measurements at a rough interface

2007-11-07

arxiv.org/abs/0711.1117v1

Physics

Condensed Matter

Soft Condensed Matter

4 pages, 5 figures

Scientific paper

An original MEMS-based force sensing device is designed which allows to measure spatially resolved normal and tangential stress fields at the base of an elastomeric film. This device is used for the study of the contact stress between a rough film and a smooth glass sphere under normal load. The measured profiles are compared to Finite Elements Method calculations for a smooth contact with boundary conditions obeying Amontons-Coulomb's friction law. The accuracy of the measurements allows to discriminate between dry and lubricated contact conditions and to evidence load-dependent deviations from Amontons-Coulomb's profiles. These deviations are qualitatively interpreted by taking into account the finite compliance of the micro-contact population.

Affiliated with

Also associated with

No associations

Rating

Local contact stress measurements at a rough interface does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Local contact stress measurements at a rough interface, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Local contact stress measurements at a rough interface will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-502720