Line Widths of Single-Electron Tunneling Oscillations: Experiment and Numerical Simulations

Details Line Widths of Single-Electron Tunneling Oscillations: Experiment and Numerical Simulations Line Widths of Single-Electron Tunneling Oscillations: Experiment and Numerical Simulations

2005-08-29

arxiv.org/abs/cond-mat/0508688v1

AIP Conference Proceedings vol. 850, p. 1442-1443 (2006)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

2 pages, 1 figure. Submitted to the 24th International Conference on Low Temperature Physics (LT24), Orlando, FL, USA, Aug. 20

Scientific paper

10.1063/1.2355244

We present experimental and numerical results from a real-time detection of time-correlated single-electron tunneling oscillations in a one-dimensional series array of small tunnel junctions. The electrons tunnel with a frequency f=I/e, where I is the current and e is the electron charge. Experimentally, we have connected a single-electron transistor to the last array island, and in this way measured currents from 5 fA to 1 pA by counting the single electrons. We find that the line width of the oscillation is proportional to the frequency f. The experimental data agrees well with numerical simulations.

Affiliated with

Also associated with

No associations

Rating

Line Widths of Single-Electron Tunneling Oscillations: Experiment and Numerical Simulations does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Line Widths of Single-Electron Tunneling Oscillations: Experiment and Numerical Simulations, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Line Widths of Single-Electron Tunneling Oscillations: Experiment and Numerical Simulations will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-404822