Lattice parameters from direct-space images at two tilts

Details Lattice parameters from direct-space images at two tilts Lattice parameters from direct-space images at two tilts

2000-01-11

arxiv.org/abs/cond-mat/0001139v2

Ultramicroscopy 94, 3-4 (2003) 245-262

Physics

Condensed Matter

Materials Science

14 pages, 7 figs, 3 tables, 25 refs, RevTeX4, notes http://www.umsl.edu/~fraundor/help/imagnxtl.htm

Scientific paper

Lattices in three dimensions are oft studied from the ``reciprocal space'' perspective of diffraction. Today, the full lattice of a crystal can often be inferred from direct-space information about three sets of non-parallel lattice planes. Such data can come from electron-phase or Z contrast images taken at two tilts, provided that one image shows two non-parallel lattice periodicities, and the other shows a periodicity not coplanar with the first two. We outline here protocols for measuring the 3D parameters of cubic lattice types in this way. For randomly-oriented nanocrystals with cell side greater than twice the continuous transfer limit, orthogonal +/-15 deg and +/-10 deg tilt ranges might allow one to measure 3D parameters of all such lattice types in a specimen from only two well-chosen images. The strategy is illustrated by measuring the lattice parameters of a 10 nm WC_{1-x} crystal in a plasma-enhanced chemical-vapor deposited thin film.

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