Lattice Misfit Measurement in Inconel 625 by X-Ray Diffraction Technique

Details Lattice Misfit Measurement in Inconel 625 by X-Ray Diffraction Technique Lattice Misfit Measurement in Inconel 625 by X-Ray Diffraction Technique

2006-04-08

arxiv.org/abs/cond-mat/0604222v1

Physics

Condensed Matter

Materials Science

Scientific paper

Determination of lattice misfit and microstructural parameters of the coherent precipitates in Ni based alloy Inconel-625 is a challenging problem as their peaks are completely overlapping among themselves and also with the matrix. We have used a novel X-ray diffraction technique on the bulk samples of Inconel 625 at different heat-treated conditions to determine the lattice parameters, the lattice misfit of the coherent precipitates with the matrix and their microstructural parameters like size and strain.

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