Laser Scanning Microscopy of HTS Films and Devices

Details Laser Scanning Microscopy of HTS Films and Devices Laser Scanning Microscopy of HTS Films and Devices

2005-12-22

arxiv.org/abs/cond-mat/0512582v1

Low Temperature Physics, Volume 32, Issue 6, pp. 592-607 (June 2006).

Physics

Condensed Matter

Superconductivity

17 pages, 21 figures, Submitted to Fizika Nizkikh Temperatur (Low Temperature Physics)

Scientific paper

10.1063/1.2215376

The work describes the capabilities of Laser Scanning Microscopy (LSM) as a spatially resolved method of testing high_Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of twobeam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging.

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