Josephson Current and Multiple Andreev Reflections in Graphene SNS Junctions

Details Josephson Current and Multiple Andreev Reflections in Graphene SNS Junctions Josephson Current and Multiple Andreev Reflections in Graphene SNS Junctions

2007-10-26

arxiv.org/abs/0710.4984v2

Phys. Rev. B 77, 184507 (2008)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

20 pages, 3 figures

Scientific paper

10.1103/PhysRevB.77.184507

The Josephson Effect and Superconducting Proximity Effect were observed in Superconductor -Graphene-Superconductor (SGS) Josephson junctions with coherence lengths comparable to the distance between the superconducting leads. By comparing the measured temperature and doping dependence of the supercurrent and the proximity induced sub-gap features (multiple Andreev reflections) to theoretical predictions we find that, contrary to expectations, the ballistic transport model fails to describe the SGS junctions. In contrast, the diffusive junction model yields close quantitative agreement with the results. This conclusion is consistent with transport measurements in the normal state, which yield mean free paths in the graphene link that are much shorter than the junction length. We show that all devices fabricated on SiO2 substrates so far (our own as well as those reported by other groups) fall in the diffusive junction category.

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