Itinerant Ferromagnetism in the electronic localization limit

Details Itinerant Ferromagnetism in the electronic localization limit Itinerant Ferromagnetism in the electronic localization limit

2008-10-22

arxiv.org/abs/0810.4081v2

Phys. Rev. Lett. 102, 096603 (2009)

Physics

Condensed Matter

Strongly Correlated Electrons

4 pages, 4 figures

Scientific paper

10.1103/PhysRevLett.102.096603

We present Hall effect, $R_{xy}(H)$, and magnetoresistance, $R_{xx}(H)$, measurements of ultrathin films of Ni, Co and Fe with thicknesses varying between 0.2-8 nm and resistances between 1 M$\Omega$ - 100 $\Omega.$ Both measurements show that films having resistance above a critical value, $R_{C}$, (thickness below a critical value, $d_{C}$) show no signs for ferromagnetism. Ferromagnetism appears only for films with $R

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