Physics – Condensed Matter – Materials Science
Scientific paper
2008-04-28
Appl. Phys. Lett. 92, 212905 (2008)
Physics
Condensed Matter
Materials Science
13 pages, 4 figures
Scientific paper
10.1063/1.2929745
Impedance measurements have been performed on a sintered polycrystalline sample of the perovskite LaBiMn4/3Co2/3O6. Colossal dielectric permittivity often is measured in this class of semiconducting materials as a result of extrinsic factors. Our results show that a large offset in the capacitance, measured on a series of samples with different thickness, is due to the interfacial polarization. This contribution then can be removed from the data, creating a general procedure for dielectric measurements in semiconducting samples.
Filippi Massimiliano
Kundu Asish K.
Kundys Bohdan
Prellier Wilfrid
Ranjith R.
No associations
LandOfFree
Interfacial contribution to the dielectric response in semiconducting LaBiMn4/3Co2/3O6 does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Interfacial contribution to the dielectric response in semiconducting LaBiMn4/3Co2/3O6, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interfacial contribution to the dielectric response in semiconducting LaBiMn4/3Co2/3O6 will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-691607