Injection statistics simulator for dynamic analysis of noise in mesoscopic devices

Details Injection statistics simulator for dynamic analysis of noise in mesoscopic devices Injection statistics simulator for dynamic analysis of noise in mesoscopic devices

1999-10-08

arxiv.org/abs/cond-mat/9910125v1

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

4 pages, revtex, 4 PS figures, accepted Semicond. Sci. Technol

Scientific paper

10.1088/0268-1242/14/11/103

We present a model for electron injection from thermal reservoirs which is applied to particle simulations of one-dimensional mesoscopic conductors. The statistics of injected carriers is correctly described from nondegenerate to completely degenerate conditions. The model is validated by comparing Monte Carlo simulations with existing analytical results for the case of ballistic conductors. An excellent agreement is found for average and noise characteristics, in particular, the fundamental unities of electrical and thermal conductances are exactly reproduced.

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