Infrared Imaging of the Nanometer-Thick Accumulation Layer in Organic Field-Effect Transistors

Details Infrared Imaging of the Nanometer-Thick Accumulation Layer in Organic Field-Effect Transistors Infrared Imaging of the Nanometer-Thick Accumulation Layer in Organic Field-Effect Transistors

2006-02-09

arxiv.org/abs/cond-mat/0602229v1

Nano Letters 6 (2), 224-228 (2006)

Physics

Condensed Matter

Soft Condensed Matter

15 pages, 4 figures

Scientific paper

We report on infrared (IR) spectro-microscopy of the electronic excitations in nanometer-thick accumulation layers in FET devices based on poly(3-hexylthiophene). IR data allows us to explore the charge injection landscape and uncovers the critical role of the gate insulator in defining relevant length scales. This work demonstrates the unique potential of IR spectroscopy for the investigation of physical phenomena at the nanoscale occurring at the semiconductor-insulator interface in FET devices.

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