Influence of the gate dielectric on the mobility of rubrene single-crystal field-effect transistors

Details Influence of the gate dielectric on the mobility of rubrene single-crystal field-effect transistors Influence of the gate dielectric on the mobility of rubrene single-crystal field-effect transistors

2004-07-12

arxiv.org/abs/cond-mat/0407293v1

APL 85, 3899-3901 (2004)

Physics

Condensed Matter

Materials Science

9 pages, 4 figures

Scientific paper

10.1063/1.1812368

We have performed a comparative study of rubrene single-crystal field-effect transistors fabricated using different materials as gate insulator. For all materials, highly reproducible device characteristics are obtained. The achieved reproducibility permits to observe that the mobility of the charge carriers systematically decreases with increasing the dielectric constant of the gate insulator, the decrease being proportional to (epsilon)-1. This finding demonstrates that the mobility of carriers in organic single-crystal field-effect transistors is an intrinsic property of the crystal/dielectric interface and that it does not only depend on the specific molecule used.

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