Influence of oxygen reduction on the structural and electronic properties of electron-doped Sr1-xLaxCuO2 thin films

Physics – Condensed Matter – Superconductivity

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

27 pages, 10 figures, to appear in Physica C

Scientific paper

10.1016/j.physc.2008.11.006

Single phase, c-axis oriented, e-doped, Sr1-xLaxCuO2 thin films were epitaxially grown on KTaO3 and DyScO3 substrates by reactive rf sputtering. As-grown films being insulating due to oxygen excess, oxygen reduction is necessary to observe superconductivity. Two different procedures were employed to reach superconductivity. On one hand an in-situ reduction process was conducted on a series of films deposited on both types of substrates. On the other hand, an ex-situ reduction procedure was performed sequentially on a single film deposited on DyScO3. The study of the influence of oxygen reduction on the structural and electronic properties of the thin films is presented and discussed.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Influence of oxygen reduction on the structural and electronic properties of electron-doped Sr1-xLaxCuO2 thin films does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Influence of oxygen reduction on the structural and electronic properties of electron-doped Sr1-xLaxCuO2 thin films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Influence of oxygen reduction on the structural and electronic properties of electron-doped Sr1-xLaxCuO2 thin films will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-429509

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.