Physics – Condensed Matter – Materials Science
Scientific paper
2004-08-05
Mater. Res. Bull., v38, 1929-38 (2003)
Physics
Condensed Matter
Materials Science
5 pages and 7 figures
Scientific paper
Resistance of vacuum deposited ${\rm Sb_2Te_3}$ films of thickness between 100-500nm has been measured in vacuum. It is found that the resistance of the polycrystalline films strongly depends on the grain size and inter-granular voids. The charge carrier are shown to cross this high resistivity inter- granular void by ohmic conduction. The barrier height as well as temperature coefficient of resistance are also shown to depend on the grain size and inter- grain voids.
Arun P.
Vedeshwar A. G.
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