In Situ Measurements of Stress Evolution in Silicon Thin Films During Electrochemical Lithiation and Delithiation

Details In Situ Measurements of Stress Evolution in Silicon Thin Films During Electrochemical Lithiation and Delithiation In Situ Measurements of Stress Evolution in Silicon Thin Films During Electrochemical Lithiation and Delithiation

2011-08-02

arxiv.org/abs/1108.0647v1

Journal of Power Sources, 195(15), 5062-5066, 2010

Physics

Condensed Matter

Materials Science

12 pages, 3 figures

Scientific paper

10.1016/j.jpowsour.2010.02.013

We report in situ measurements of stress evolution in a silicon thin-film electrode during electrochemical lithiation and delithiation by using the Multi-beam Optical Sensor (MOS) technique. Upon lithiation, due to substrate constraint, the silicon electrode initially undergoes elastic deformation, resulting in rapid rise of compressive stress. The electrode begins to deform plastically at a compressive stress of ca. -1.75 GPa; subsequent lithiation results in continued plastic strain, dissipating mechanical energy. Upon delithiation, the electrode first undergoes elastic straining in the opposite direction, leading to a tensile stress of ca. 1 GPa; subsequently, it deforms plastically during the rest of delithiation. The plastic flow stress evolves continuously with lithium concentration. Thus, mechanical energy is dissipated in plastic deformation during both lithiation and delithiation, and it can be calculated from the stress measurements; we show that it is comparable to the polarization loss. Upon current interrupt, both the film stress and the electrode potential relax with similar time-constants, suggesting that stress contributes significantly to the chemical potential of lithiated-silicon.

Affiliated with

Also associated with

No associations

Rating

In Situ Measurements of Stress Evolution in Silicon Thin Films During Electrochemical Lithiation and Delithiation does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with In Situ Measurements of Stress Evolution in Silicon Thin Films During Electrochemical Lithiation and Delithiation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and In Situ Measurements of Stress Evolution in Silicon Thin Films During Electrochemical Lithiation and Delithiation will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-510562