Physics – Condensed Matter – Materials Science
Scientific paper
2011-08-02
Electrochemistry Communications, 12(11), 1614-1617, 2010
Physics
Condensed Matter
Materials Science
8 pages, 3 figures
Scientific paper
10.1016/j.elecom.2010.09.008
We report in situ measurement of biaxial moduli of a Si thin-film electrode as a function of its lithium concentration. During lithiation, biaxial compressive stress is induced in the Si film and it undergoes plastic flow. At any state-of-charge (SOC), a relatively small delithiation-relithiation sequence unloads and reloads the film elastically. From the stress and strain changes during a delithiation-relithiation cycle, the biaxial modulus of the film is calculated. Stress change is obtained by measuring the change in substrate curvature using a Multi-beam Optical Sensor; the elastic strain change is obtained from the change in SOC. By repeating these measurements at several different values of SOC, the biaxial modulus was seen to decrease from ca. 70 GPa for Li0.32Si to ca. 35 GPa for Li3.0Si. Such a significant reduction in elastic modulus has important implications for modeling stress evolution and mechanical degradation in Si-based anodes.
Chon Michael J.
Guduru Pradeep R.
Sethuraman Vijay A.
Shimshak Maxwell
Winkle Nathan Van
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