Impact of the tip radius on the lateral resolution in piezoresponse force microscopy

Details Impact of the tip radius on the lateral resolution in piezoresponse force microscopy Impact of the tip radius on the lateral resolution in piezoresponse force microscopy

2007-03-30

arxiv.org/abs/cond-mat/0703793v1

New J. Phys. 10, 013019 (2008)

Physics

Condensed Matter

Materials Science

Scientific paper

10.1088/1367-2630/10/1/013019

We present a quantitative investigation of the impact of tip radius as well as sample type and thickness on the lateral resolution in piezoresponse force microscopy (PFM) investigating bulk single crystals. The observed linear dependence of the width of the domain wall on the tip radius as well as the independence of the lateral resolution on the specific crystal-type are validated by a simple theoretical model. Using a Ti-Pt-coated tip with a nominal radius of 15 nm the so far highest lateral resolution in bulk crystals of only 17 nm was obtained.

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