Impact of Phonon Surface Roughness Scattering on Thermal Conductivity of Thin Si Nanowires

Details Impact of Phonon Surface Roughness Scattering on Thermal Conductivity of Thin Si Nanowires Impact of Phonon Surface Roughness Scattering on Thermal Conductivity of Thin Si Nanowires

2009-02-27

arxiv.org/abs/0902.4735v1

Physics

Condensed Matter

Other Condensed Matter

12 pages, 4 figures

Scientific paper

10.1103/PhysRevLett.102.125503

We present a novel approach for computing the surface roughness-limited thermal conductivity of silicon nanowires with diameter D < 100 nm. A frequency-dependent phonon scattering rate is computed from perturbation theory and related to a description of the surface through the root-mean-square roughness height Delta and autocovariance length L. Using a full-phonon dispersion relation, we find a quadratic dependence of thermal conductivity on diameter and roughness as (D/\Delta)^2. Computed results show excellent agreement with experimental data for a wide diameter and temperature range (25-350 K), and successfully predict the extraordinarily low thermal conductivity of 2 W.m^{-1}.K^{-1} at room temperature in rough-etched 50 nm silicon nanowires.

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