Imaging of Microscopic Sources of Resistive and Reactive Nonlinearities in Superconducting Microwave Devices

Details Imaging of Microscopic Sources of Resistive and Reactive Nonlinearities in Superconducting Microwave Devices Imaging of Microscopic Sources of Resistive and Reactive Nonlinearities in Superconducting Microwave Devices

2006-09-11

arxiv.org/abs/cond-mat/0609244v1

IEEE Transactions on Applied Superconductivity, Volume 17, Issue 2, June 2007 Page(s):902 -- 905

Physics

Condensed Matter

Superconductivity

4 pages, 6 figures, 2-column format,submitted for the 2006 Applied Superconductivity Conference

Scientific paper

10.1109/TASC.2007.897322

The technique of low-temperature Laser Scanning Microscopy (LSM) has been applied to the investigation of local microwave properties in operating YBa2Cu3O7/LaAlO3 thin-film resonators patterned into a meandering strip transmission line. By using a modified newly developed procedure of spatially-resolved complex impedance partition, the influence of inhomogeneous current flow on the formation of nonlinear (NL) microwave response in such planar devices is analyzed in terms of the independent impact from resistive and inductive components. The modified procedure developed here is dramatically faster than our previous method. The LSM capability to probe the spatial variations of two-tone, third-order intermodulation currents on micron length scales is used to find the 2D distribution of the local sources of microwave NL. The results show that the dominant sources of microwave NL are strongly localized in the resistive domains.

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