Identifying vacancy complexes in compound semiconductors with positron annihilation spectroscopy: a case study of InN

Details Identifying vacancy complexes in compound semiconductors with positron annihilation spectroscopy: a case study of InN Identifying vacancy complexes in compound semiconductors with positron annihilation spectroscopy: a case study of InN

2011-04-13

arxiv.org/abs/1104.2498v1

Physics

Condensed Matter

Materials Science

10 pages, 6 figures

Scientific paper

10.1103/PhysRevB.84.125201

We present a comprehensive study of vacancy and vacancy-impurity complexes in InN combining positron annihilation spectroscopy and ab-initio calculations. Positron densities and annihilation characteristics of common vacancy-type defects are calculated using density functional theory and the feasibility of their experimental detection and distinction with positron annihilation methods is discussed. The computational results are compared to positron lifetime and conventional as well as coincidence Doppler broadening measurements of several representative InN samples. The particular dominant vacancy-type positron traps are identified and their characteristic positron lifetimes, Doppler ratio curves and lineshape parameters determined. We find that In vacancies and their complexes with N vacancies or impurities act as efficient positron traps, inducing distinct changes in the annihilation parameters compared to the InN lattice. Neutral or positively charged N vacancies and pure N vacancy complexes on the other hand do not trap positrons. The predominantly introduced positron trap in irradiated InN is identified as the isolated In vacancy, while in as-grown InN layers In vacancies do not occur isolated but complexed with one or more N vacancies. The number of N vacancies per In vacancy in these complexes is found to increase from the near surface region towards the layer-substrate interface.

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