Identification of vacancy defects in a thin film perovskite oxide

Details Identification of vacancy defects in a thin film perovskite oxide Identification of vacancy defects in a thin film perovskite oxide

2009-06-30

arxiv.org/abs/0906.5558v1

Physics

Condensed Matter

Materials Science

16 pages, 2 figures, 1 Table

Scientific paper

Vacancy defects in thin film laser ablated SrTiO3 on SrTiO3 were identified using variable energy positron annihilation lifetime measurements. Strontium vacancy related defects were the dominant positron traps and, apart from in the top ~ 50 nm, were found to be uniformly distributed. The surface layer showed an increase in annihilation from larger open-volume defects, large vacancy clusters or nanovoids.

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