High-resolution soft x-ray photoemission study of a Kondo semiconductor and related compounds

Details High-resolution soft x-ray photoemission study of a Kondo semiconductor and related compounds High-resolution soft x-ray photoemission study of a Kondo semiconductor and related compounds

2004-10-14

arxiv.org/abs/cond-mat/0410366v1

Physics

Condensed Matter

Strongly Correlated Electrons

4 pages including 3 figures, to appear in Journal of Electron Spectroscopy and Related Phenomena

Scientific paper

We have performed the bulk-sensitive high-resolution soft x-ray photoemission study of a Kondo semiconductor CeRhAs and related compounds CeNiSn and CePdSn. The comparison of the spectra of polycrystalline CePdSn on the fractured and scraped surfaces shows that the fracturing of the samples is much better than the scraping in order to obtain intrinsic photoemission spectra. The Ce 4d core-level spectra show clear differences in the electronic states among the materials.

Affiliated with

Also associated with

No associations

Rating

High-resolution soft x-ray photoemission study of a Kondo semiconductor and related compounds does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with High-resolution soft x-ray photoemission study of a Kondo semiconductor and related compounds, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High-resolution soft x-ray photoemission study of a Kondo semiconductor and related compounds will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-664014