High Frequency Quantum Admittance and Noise Measurement with an On-chip Resonant Circuit

Details High Frequency Quantum Admittance and Noise Measurement with an On-chip Resonant Circuit High Frequency Quantum Admittance and Noise Measurement with an On-chip Resonant Circuit

2011-10-26

arxiv.org/abs/1110.5834v2

Phys.Rev.B 85, 085435 (2012)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

15 pages, 15 figures

Scientific paper

10.1103/PhysRevB.85.085435

By coupling a quantum detector, a superconductor-insulator-superconductor junction, to a Josephson junction \textit{via} a resonant circuit we probe the high frequency properties, namely the ac complex admittance and the current fluctuations of the Josephson junction at the resonant frequencies. The admittance components show frequency dependent singularities related to the superconducting density of state while the noise exhibits a strong frequency dependence, consistent with theoretical predictions. The circuit also allows to probe separately the emission and absorption noise in the quantum regime of the superconducting resonant circuit at equilibrium. At low temperature the resonant circuit exhibits only absorption noise related to zero point fluctuations, whereas at higher temperature emission noise is also present.

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