Height Fluctuations and Intermittency of $V_2 O_5$ Films by Atomic Force Microscopy

Details Height Fluctuations and Intermittency of $V_2 O_5$ Films by Atomic Force Microscopy Height Fluctuations and Intermittency of $V_2 O_5$ Films by Atomic Force Microscopy

2003-06-02

arxiv.org/abs/cond-mat/0306035v1

J. Phys.: Condens. Matter 15 (2003) 1889

Physics

Condensed Matter

Statistical Mechanics

6 pages (two columns), 11 eps. figures, latex

Scientific paper

The spatial scaling law and intermittency of the $V_2 O_5$ surface roughness by atomic force microscopy has been investigated. The intermittency of the height fluctuations has been checked by two different methods, first, by measuring scaling exponent of q-th moment of height-difference fluctuations i.e. $C_q = < |h(x_1) - h(x_2)|^{q} >$ and the second, by defining generating function $Z(q,N)$ and generalized multi-fractal dimension $D_q$. These methods predict that there is no intermittency in the height fluctuations. The observed roughness and dynamical exponents can be explained by the numerical simulation on the basis of forced Kuramoto-Sivashinsky equation.

Affiliated with

Also associated with

No associations

Rating

Height Fluctuations and Intermittency of $V_2 O_5$ Films by Atomic Force Microscopy does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Height Fluctuations and Intermittency of $V_2 O_5$ Films by Atomic Force Microscopy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Height Fluctuations and Intermittency of $V_2 O_5$ Films by Atomic Force Microscopy will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-484625