Physics – Condensed Matter – Materials Science
Scientific paper
2009-05-19
Phys. Rev. B 80, 073408 (2009)
Physics
Condensed Matter
Materials Science
Accepted in Physical Review B with minor changes
Scientific paper
10.1103/PhysRevB.80.073408
In-situ high pressure Raman spectroscopy is used to study monolayer, bilayer and few-layer graphene samples supported on silicon in a diamond anvil cell to 3.5 GPa. The results show that monolayer graphene adheres to the silicon substrate under compressive stress. A clear trend in this behaviour as a function of graphene sample thickness is observed. We also study unsupported graphene samples in a diamond anvil cell to 8 GPa, and show that the properties of graphene under compression are intrinsically similar to graphite. Our results demonstrate the differing effects of uniaxial and biaxial strain on the electronic bandstructure.
Coleman Jonathan N.
Gregoryanz Eugene
Halsall Matthew P.
Lotya Mustafa
Novoselov Konstantin S.
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