Full Potential Multiple Scattering for X-ray Spectroscopies

Details Full Potential Multiple Scattering for X-ray Spectroscopies Full Potential Multiple Scattering for X-ray Spectroscopies

2007-02-22

arxiv.org/abs/cond-mat/0702528v7

Physical Review B (Vol.76, No.6) 060102 (Rapid Communications) (2007)

Physics

Condensed Matter

Materials Science

4 pages 2 figures

Scientific paper

10.1103/PhysRevB.76.060102

We present a Full Potential Multiple Scattering (FP-MS) scheme for the interpretation of several X-ray spectroscopies that is a straightforward generalization of the more conventional Muffin-Tin (MT) version. Like this latter, it preserves the intuitive description of the physical process under consideration and overcomes some of the limitations of the existing FP-MS codes. It hinges on a fast and efficient method for solving the single cell scattering problem that avoids the convergence drawbacks of the angular momentum (AM) expansion of the cell shape function and relies on an alternative derivation of the multiple scattering equations (MSE) that allows us to work reliably with only one truncation parameter, {\it i.e.} the number of local basis functions in the expansion of the global scattering function determined by the classical relation $l_{\rm max} \sim k R$.

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