Physics – Condensed Matter – Superconductivity
Scientific paper
2010-03-29
Supercond. Sci. Technol. 22 (2009) 064006
Physics
Condensed Matter
Superconductivity
16 pages, 6 figures, 1 table
Scientific paper
10.1088/0953-2048/22/6/064006
Focused ion beam (FIB) technology has been used to fabricate miniature Nb DC SQUIDs which incorporate resistively-shunted microbridge junctions and a central loop with a hole diameter ranging from 1058 nm to 50 nm. The smallest device, with a 50 nm hole diameter, has a white flux noise level of 2.6 microphy_{0}/Hz^{0.5} at 10^{4} Hz. The scaling of the flux noise properties and focusing effect of the SQUID with the hole size were examined. The observed low-frequency flux noise of different devices were compared with the contribution due to the spin fluctuation of defects during FIB processing and the thermally activated flux hopping in the SQUID washer.
Lam Simon K. H.
Pakes Christopher I.
Prawer Steven
Tettamanzi Giuseppe Carlo
No associations
LandOfFree
Flux noise in ion-implanted nanoSQUIDs does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Flux noise in ion-implanted nanoSQUIDs, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Flux noise in ion-implanted nanoSQUIDs will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-499377