Finding the reconstructions of semiconductor surfaces via a genetic algorithm

Details Finding the reconstructions of semiconductor surfaces via a genetic algorithm Finding the reconstructions of semiconductor surfaces via a genetic algorithm

2004-08-11

arxiv.org/abs/cond-mat/0408228v2

Surface Science 573, L375 - L381 (2004)

Physics

Condensed Matter

Materials Science

4 figures, 1 table

Scientific paper

10.1016/j.susc.2004.09.041

In this article we show that the reconstructions of semiconductor surfaces can be determined using a genetic procedure. Coupled with highly optimized interatomic potentials, the present approach represents an efficient tool for finding and sorting good structural candidates for further electronic structure calculations and comparison with scanning tunnelling microscope (STM) images. We illustrate the method for the case of Si(105), and build a database of structures that includes the previously found low-energy models, as well as a number of novel configurations.

Affiliated with

Also associated with

No associations

Rating

Finding the reconstructions of semiconductor surfaces via a genetic algorithm does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Finding the reconstructions of semiconductor surfaces via a genetic algorithm, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Finding the reconstructions of semiconductor surfaces via a genetic algorithm will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-208021